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R&D Center

Central Instrumentation Facility

The Central Instrumentation Facility houses multiple high-end and analytical instruments to facilitate research and teaching. The facility is mainly used for research and training purposes. The facility has two components: Sophisticated Instrument Facility (SIF) and Central Analytical Laboratory (CAL), which houses high-end instruments used for research purposes in the field of Science and Engineering. It also includes a high-performance computing (HPC) facility. A team of faculty members and dedicated staff takes care of the facility and its operation. The SIF provides services to both internal and external users on a payment basis. The details of instruments housed under SIF can be accessed at https://discovery.bits-pilani.ac.in/SIF/. Services are booked online by both internal and external users. CAL houses several scientific and analytical instruments that are majorly used for different teaching courses in physics, chemistry, biological sciences, pharmacy, and engineering offered by the institute. 

CAL

Equipments

Below is the list of instruments with make and model:

Equipment
Make and Model
Field Emission Scanning Electron Microscope (FESEM)
Make: FEI
Model: Apreo LoVac
FULLY SPECTRAL CONFOCAL LASER SCANNING MICROSCOPE
Make: Carl Zeiss
Model: LSM 880
GAS CHROMATOGRAPHY –MASS SPECTROMETRY (GC-MS/MS)
Olympus Corporation FV3000
Raman Spectrometer
LAB RAM HR Horiba
X-ray Diffractometer
Bruker D8 Advance
Nuclear Magnetic Resonance (NMR) spectrometer
Bruker AVANCE NEO 500 MHz
Nano Particle Analyzer & Autotitrator
Nanoplus & Nanoplus AT
Sputter coater
LEICA EM ACE-200
Critical Point Drying
LEICA EM CPD-300
Ultramicrotome
LEICA EM UC7
Tissue processor
LEICA EM TP

 

EQUIPMENTS
Field Emission Scanning Electron Microscope (FESEM)

Field Emission Scanning Electron Microscope (FESEM)

Make: FEI

Model: Apreo LoVac

Applications:

  • Topographical morphology & Microstructural analysis of materials including biological cell.
  • Particle size measurement of nanomaterials.
  • Chemical composition analysis of materials with EDS detector.
Fully Spectral Confocal Laser Scanning Microscope (FSCLSM)

FULLY SPECTRAL CONFOCAL LASER SCANNING MICROSCOPE (FSCLSM)

Make: Carl Zeiss

Model: LSM 880

Applications:

  • Multi-colour, live/fixed cell and DIC imaging.
  • Z- stacks, 3D image reconstruction, Tile scan.
  • Time series (with or without Z-stack), Co-localization analysis, bleaching, Airyscan, FCS.
  • Topography analysis, surface roughness and Zheight profiling.
Nuclear Magnetic Resonance (NMR)

Nuclear Magnetic Resonance(NMR)

Make: Bruker

Model: AV NEO (400MHz)

Applications:

  • Analysis of 1D NMR: Proton (1H), Carbon (13C), Fluorine (19F), Phosphorus (31P).
  • Analysis of 2D NMR: COSY, NOESY, HMBC, HSQC.
Gas Chromatography–Mass Spectroscopy (GC-MS/MS )

Gas Chromatography–Mass Spectroscopy(GCMS/MS )

Make: Shimadzu

Model: TQ8040 CI/NCI

Applications:

  • Qualitative and quantitative analysis of organic compounds.
  • Mechanistic study of fragmentation process under mass spectrometric condition.
  • Molar mass and structural analysis of small biomolecules.
X-Ray Photoelectron Spectrometer (XPS)

X-Ray Photoelectron Spectrometer(XPS)

Make: Thermo Scientific

Model: K Alpha

Applications:

  • Surface chemistry analysis of the materials
  • Measurement of depth profile.
  • Measuring the energies of the valence states of metallic, semiconducting and adsorbate-covered metal and semiconducting surfaces.
BET-Chemisorption Analyzer

BET-Chemisorption Analyzer

Make: Anton Paar

Model: Autosorb iQ-C-XR-XR-XR

Applications:

  • Measurement of specificsurface area of micro/nano particles.
  • Measurement of pore size, pore volume and pore size distribution of micro/nano particle.
Raman Spectrometer- Atomic Force Microscope

Raman Spectrometer- Atomic Force Microscope

Make: Horiba/AIST-NT

Model: LabRam HR Evolution, Omega Scope

Applications:

Raman:

  • Phase identification of polymorphic solids.
  • Polymer identification, Composition determination.
  • Determination of residual strain and crystallographic orientation.

AFM:

  • Surface morphology at atomic scale.
  • Roughness and grain size measurement of thin films
Single Crystal XRD

Impedance Analyzer

Make: Rigaku

Model: XtaLAB Pro2 Mo

Applications:

  • Measurement of particle size distribution.
  • Measurement of Zeta potential.
Nano-particle Analyzer with Rheometer

Nano-particle Analyzer with Rheometer

Make: Anton Paar

Model: Litesizer 500

Applications:

  • Measurement of particle size distribution.
  • Measurement of Zeta potential.
Impedance Analyzer

Impedance Analyzer

Make: Keysight Technologies

Model: E4990A

Applications:

  • Measures impedance against frequency and temperature of materials & nanocomposites.
  • Measurement of dielectric primitivity and conductivity over a large frequency range.
Semiconductor Parameter Analyzer

Semiconductor Parameter Analyzer

Make: Convergent Technology

Model: Keithley 4200ASCS

Applications:

  • Advanced measurement hardware for DC I-V, C-V, and pulsed I-V measurement types.

Contact Details

Other R&D Centres

Center for Research Excellence in Semiconductor Technologies (CREST)

AI Centre

Central Analytical Laboratory

Teaching Learning Centre