VLSI Test Workshop provides a comprehensive examination of advanced design-for-test (DFT) methodologies and essential testing techniques for contemporary VLSI systems. Participants will explore topics such as scan-based testing, memory testing, and fault modeling, gaining insights into enhancing testability and fault detection. The workshop features presentations from industry leaders, career development sessions, and hands-on laboratory experiences with cutting-edge testing tools. Additionally, attendees will have valuable networking opportunities to connect with professionals and researchers, making this event ideal for anyone seeking to deepen their knowledge in VLSI testing and semiconductor design.

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