Dr. Nijjwal Karak

Assistant Professor
Department of Mathematics

Geometric Function Theory, Geometric Analysis, Theory of Function Spaces
Birla Institute of Technology & Science, Pilani
Hyderabad Campus
Jawahar Nagar, Kapra Mandal
Dist.-Medchal-500 078
Telangana, India


  1. Removable sets for Orlicz-Sobolev spaces. Potential Analysis (SCIE, Springer), 43(4): 675-694, 2015.

  2. (With Pekka Koskela) Lebesgue points via the Poincaré inequality. Science China Mathematics (SCIE, Springer), 58(8): 1697-1706, 2015.

  3. (With Pekka Koskela) Capacities and Hausdorff measures on metric spaces. Revista Matematica Complutense (SCIE, Springer), 28(3): 733-740, 2015.

  4. Generalized Lebesgue points for Sobolev functions. Czechoslovak Mathematical Journal (SCIE, Springer), 67(1): 143-150, 2017.

  5. Measure density and embeddings of Hajlasz-Besov and Hajlasz-Triebel Lizorkin spaces. Journal of  Mathematical Analysis and Applications (SCIE, Elsevier), 475(1): 966-984, 2019.

  6. Removable sets for weighted Orlicz-Sobolev Spaces. Computational Methods and Function Theory (SCIE, Springer), 19(3): 473-486, 2019.

  7. Lower bound of measure and embeddings of Sobolev, Besov and Triebel-Lizorkin spaces. Mathematische Nachrichten (SCIE, Wiley), 293(1): 120-128, 2020.

  8. Triebel-Lizorkin capacity and Haudorff measure in metric spaces. Mathematica Slovaca (SCIE, De Gruyter), 70(3): 617-624, 2020.

  9. (With Przemslaw Gorka and Daniel J. Pons) Variable exponent Sobolev spaces and regularity of domains. Journal of Geometric Analysis (SCIE, Springer), 31(7): 7304-7319, 2021.

  10. (With Toni Heikkinen) Orlicz-Sobolev embeddings, extensions and Orlicz-Poincaré inequalities. Journal of Functional Analysis (SCIE, Elsevier), 282(2): Paper No. 109292, 2022. 

  11. (With Debarati Mondal) Besov and Triebel-Lizorkin capacity in metric spaces. Mathematica Slovaca (SCIE, De Gruyter), accepted.

  12. (With Przemslaw Gorka and Daniel J. Pons) Variable exponent Sobolev spaces and regularity of domains-II. Revista Matematica Complutense (SCIE, Springer), accepted.