About Me

I did my M.Sc.. in Physics, from I.I.T. Kharagpur and PhD from University of Heidelberg, Germany. I started my post-doctoral research at the same laboratory in Heidelberg and then, moved on to Georgia Institute of Technology, Atlanta, USA. After that, I joined as a visiting scientist in Max Planck Institute for Microstructure Physics,Halle. Nextly, I worked as a postdoctoral fellow in Electronics & Telecommunications Research Institute (E.T.R.I.), Taejon, S. Korea for one year. After that, I joined as a postdoctoral fellowat the Institute of Physics, Academia Sinica, Taipei, Taiwan for two years. Then I came back to India, and I was a visiting assistant professor in Department of Physics, I.I.T. Kanpur before joining B.I.T.S.

My PhD was an experimental work on study of thin organic molecular films with scanning tunneling microscopy. In post-doctoral research I worked on surface studies of different types of thin films (e.g. metallic, semiconducting etc.) using surface analytical techniques of XPS, AES, LEED and SPM. In Kanpur, I worked on AFM of porous silicon. Thus, research interest is a wide range of topics including preparation of different types of thin films and their characterization with SPM & other surface analytical techniques; thin film devices.